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892 Views 0 Replies Latest reply: Mar 1, 2011 3:40 AM by Tom@Bbite RSS
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Mar 1, 2011 3:40 AM

LTE-Advanced, a new communications test set for mobile device manufacturing? Benefit or added compexity?

LTE-Advanced continues to progress as a new communications test set for mobile device manufacturing, performance and conformance testing of LTE user equipment but does it ease testing or add an extra layer of compexity when time to market and added fuctionality are critical and wanted by the public?

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Tags: power, design, software, rf, semiconductor, test, measurement, application, signal, tektronix, manual, fluke, can, data, research, oscilloscope, pico, computer, switching, pc, lte, spectrum, characterization, pxi, keith

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