More than 3 ways of testing with a Vector Network Analyser?

More than 3 convential ways of testing with a Vector Network Analyser?

VNA-based test solutions find their way into a variety of applications. If characterizing embedded devices, for example, there are OK approaches (using the VNA alone); good (using the VNA with some type of
built-in de-embedding methodology); or better (using the VNA with a probing station).

All three of these conventional approaches have limits. But is Time Domain Substitution, which claims to simplify de-embedding and rivals full-cal accuracy at the DUT valid?

Are there other new practises?