Free Multicity Seminar Teaches Strategies to Speed Product Design Life Cycles

National Instruments and Tektronix announced open registration for the Measurement and Analysis Techniques for Embedded System Design Engineers Seminar, a free half-day technical event that helps engineers increase efficiency in their embedded system design processes. Held from March 2 through May 18 in 11 cities, the seminar focuses on time-saving techniques for measurement and analysis and illustrates how integrating tools such as Tektronix oscilloscopes with NI LabVIEW graphical system design software can significantly enhance design efficiency and accuracy.

The event features sessions from Tektronix and National Instruments that equip attendees with the knowledge and tools to speed their product design life cycles through effective debugging and verification. Attendees can gain insight from experts from both companies on how to efficiently test and verify their designs through precise serial bus decode measurements, instrument control, timing and power analysis and report generation. Additionally, engineers can learn best practices for scaling development efforts from design to test with hybrid test systems.

The seminar includes three sessions in which measurement experts from Tektronix and National Instruments explore in detail techniques for achieving efficiency gains. The presenters discuss the following concepts:

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Tags: embedded, test, free, seminar, measurement

Feb 3, 2010 10:33 AM

Free Multicity Seminar Teaches Strategies to Speed Product Design Life Cycles

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