Problem: When debugging electromagnetic interference (EMI) problems, electronic design engineers face the challenge of identifying the sources of unwanted emissions and developing a solution for them. Repetitive testing at the EMC compliance laboratory to identify and resolve these problems is costly and often significantly delays the product launch. Frequent EMI testing throughout the complete development process reduces the probability of a major redesign, effectively decreasing product launch costs and delays.
Solution: Digital oscilloscopes in combination with near-field probe sets are powerful instruments for debugging during design. They allow designers to quickly locate and analyze EMI problems early on. Fast Fourier transformation (FFT) implementations provide a fast update rate and the FFT frame overlay processing and persistence display provides insights into the structure of unwanted emissions.
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